Category Archives: TP200 Touch Probe

TP200 is a compact, module-changing probe, that uses strain-gauge mechanisms for higher accuracy and longer life than kinematic touch-trigger probes such as the TP2, TP6 & TP20.

Renishaw TP200 CMM Touch Probe Specifications

Posted on December 5, 2010 by CMM

Summary TP200 TP200B Principal application Where high accuracy is required. As TP200 but where ‘air’ trigger events occur.  Sense directions 6-axis: ±X, ±Y, ±Z 6-axis: ±X, ±Y, ±Z Unidirectional repeatability (2s µm) Trigger level 1:  0.40 µmTrigger level 2:  0.50 µm Trigger level 1:  … Continue reading →

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Renishaw TP200 CMM Touch Trigger Probe

Posted on December 5, 2010 by CMM

The TP200 is a compact, module-changing probe, that uses strain-gauge mechanisms for higher accuracy and longer life than kinematic touch-trigger probes such as the TP20.    TP200 stylus modules – choice of fixed overtravel forces: SF (standard force) or LF (low force). The TP200 probe uses … Continue reading →

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